PRE-OWNED EQUIPMENT
Equipment Catalogue
Reference listings, not live inventory. Quantity, condition, location, availability and lead time must be individually confirmed. Requirements for unlisted equipment are welcome.
Analytical instruments
Datacolor 650 Spectrophotometer
Analytical instruments
Thermo Plus DSC8230 / 8120 Thermal Analysis System
Analytical instruments
Rigaku TG8120 Thermal Analysis System
Metrology
Nikon MR-1+3030 Automated Video Measuring System
Interferometers
WYKO NT1100 White-light Interferometer
Metrology
Tokyo Seimitsu SURFCOM 3000A Contour Measuring Instrument
Analytical instruments
TUX-3300N X-ray Instrument
Microscopes
Olympus DP71 / WIZARD900 Metallurgical Microscope
Metrology
LP31 Laser Level
Analytical instruments
HunterLab UltraScan PRO Spectrophotometer
Analytical instruments
HunterLab ColorQuest XE Spectrophotometer
Analytical instruments
Thermo EVOLUTION 201 UV Spectrophotometer
Metrology
Mitaka NH-4N 3D Measuring System
Other equipment
6000 W Power Supply
Metrology
OGP ZIP250 Automated Video Measuring System
Microscopes
Olympus BX53M Microscope
Microscopes
ZEISS Imager.M1 AX10 Microscope
Analytical instruments
A&D Electronic Balance, 30 kg
Metrology
Olympus USPM-RU III Reflectance Measuring System
Microscopes
Olympus MX61 Microscope
Metrology
KEYENCE VL-770
Microscopes
KEYENCE VHX-950F Microscope
Interferometers
KEYENCE WI-5000 White-light Interferometer
Interferometers
Bruker Contour GT White-light Interferometer
Metrology
Taylor Hobson Form Talysurf Series 2 Contour Instrument
Microscopes
Nikon MM-800 Measuring Microscope
Microscopes
Nikon ECLIPSE L200N Microscope
Metrology
Nikon VMR-6555 Video Measuring System
Metrology
TRIOPTICS ImageMaster HR / OptiSpheric HR MTF Measuring System
Interferometers
ZYGO NewView 7300 White-light Interferometer
Interferometers
ZYGO 12-inch Laser Interferometer
Interferometers
ZYGO GPI XP 4-inch Laser Interferometer
Interferometers
ZYGO NewView White-light Interferometer
Interferometers
ZYGO
Metrology
ZEISS PRISMO 795
Electron microscopes
Hitachi Miniscope TM3030 Tabletop SEM
Electron microscopes
Hitachi SU1510 Tungsten-filament SEM
Electron microscopes
JEOL JSM-7400F Field-emission SEM
Electron microscopes
JEOL JSM-6390LA SEM
Electron microscopes
JEOL JSM-7500F Field-emission SEM
Electron microscopes
JEOL JEM-9320 FIB System
Electron microscopes
JEOL JSM-6610LA SEM
Electron microscopes
JEOL JSM-6510 SEM
Metrology
Leica AT901-B Laser Tracker
Analytical instruments
TA DSC Q100 Differential Scanning Calorimeter
Metrology
FARO Articulated Measuring Arm, 3.7 m
Analytical instruments
METTLER TOLEDO MS105DU Balance
Analytical instruments
METTLER TOLEDO AX205 Balance
Microscopes
Lasertec OPTELICS HYBAID Laser Confocal Microscope
Microscopes
Olympus DSX510 Optical Microscope
Interferometers
Veeco NT9100 White-light Interferometer
Interferometers
DW10 Laser Interferometer
Metrology
Mitutoyo CS-H5000 CNC Surface Roughness and Contour Measuring System
Interferometers
ZYGO APM-300
Interferometers
ZYGO CP300I Part Holder
Microscopes
KEYENCE VK-X1050 Laser Confocal Microscope
Metrology
KEYENCE IM-6120 Image Dimension Measuring System
Interferometers
Veeco WYKO SP3200 Optical Profiler / White-light Interferometer
Metrology
MICRO.VU EXCEL501UC Automated Video Measuring System (2D / 2.5D)
Analytical instruments
Thermo Scientific HAAKE MARS Rheometer
Analytical instruments
TA DHR Rheometer
Analytical instruments
Brookfield DV-II+ Pro RV Viscometer
Microscopes
KEYENCE VHX-S550
Metrology
KEYENCE TM-X5000 Projection Measuring System
Electron microscopes
Hitachi S4700 SEM
Metrology
Kosaka Surface Roughness Instrument
Electron microscopes
Hitachi TM4000PLUS SEM
Analytical instruments
TA Q2000 Differential Scanning Calorimeter
Microscopes
KEYENCE VHX-5000
Metrology
KEYENCE IM7020
Metrology
Olympus USPM-RU-W Reflectance Measuring System
Metrology
Nikon VMZ-R3020 Video Measuring System
Metrology