Electron microscopes · JM-041

JEOL JEM-9320 FIB System

Availability to be confirmedQuantity, condition and lead time are subject to confirmation.

Notes

With EDS; configuration to be confirmed.

Request details

Use our contact form or email us with reference JM-041. We can discuss specifications, condition and quotation details. Any inspection arrangements are subject to confirmation.

More electron microscopes

$Hitachi Miniscope TM3030 Tabletop SEM$

Hitachi Miniscope TM3030 Tabletop SEM

JM-036

Hitachi SU1510 Tungsten-filament SEM

JM-037

JEOL JSM-7400F Field-emission SEM

JM-038

JEOL JSM-6390LA SEM

JM-039

JEOL JSM-7500F Field-emission SEM